The Stanford-Binet Test traces its roots to the Binet-Simon Scale, French device for identifying levels of intelligence. The Binet-Simon Scale was developed by Alfred Binet and Theodore Simon. It is used to detect children that possessed notably below-average levels of intelligence for their age and also gifted children. The Stanford Binet Intelligence Test has been revised 4 times until its final version. It can be used on any age from 2 years of age upward by a specialist. The Stanford-Binet test is an examination meant to gauge intelligence. It is not a time-based test.